Operation method for control materials and automated analyzer

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United States of America Patent

PATENT NO 10781440
APP PUB NO 20180030433A1
SERIAL NO

15550502

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An automatic analyzer including a function for operating control materials and its operation method are provided. The analyzer is configured to start sampling by giving priority to an entirety of control materials corresponding to all assay items required for measurement. The analyzer is also configured to automatically start sampling of a patient specimen based on a preliminarily set sampling timing after completion of sampling of the entirety of control materials. The analyzer is also configured to stop, when an abnormality is present in a measurement result of at least any one of control materials in the group of control materials, sampling of a patient specimen corresponding to a control material in which the abnormality is found, and notify a tester of the abnormality.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO

International Classification(s)

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  • 2015 Application Filing Year
  • C12Q Class
  • 3483 Applications Filed
  • 2244 Patents Issued To-Date
  • 64.43 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maeda, Kohshi Tokyo, JP 14 54
Morishima, Daisuke Tokyo, JP 7 18
Tamura, Terumi Tokyo, JP 17 195

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges334613906117511101 - 1011 - 2021 - 3031 - 4041 - 5071 - 80100 +020040060080010001200140016001800200022002400260028003000320034003600

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