Operation method for control materials and automated analyzer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 22, 2020
Grant Date -
Feb 1, 2018
app pub date -
Feb 23, 2015
filing date -
Feb 23, 2015
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An automatic analyzer including a function for operating control materials and its operation method are provided. The analyzer is configured to start sampling by giving priority to an entirety of control materials corresponding to all assay items required for measurement. The analyzer is also configured to automatically start sampling of a patient specimen based on a preliminarily set sampling timing after completion of sampling of the entirety of control materials. The analyzer is also configured to stop, when an abnormality is present in a measurement result of at least any one of control materials in the group of control materials, sampling of a patient specimen corresponding to a control material in which the abnormality is found, and notify a tester of the abnormality.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HITACHI HIGH-TECH CORPORATION | 17-1 TORANOMON 1-CHOME MINATO-KU TOKYO |
International Classification(s)

- 2015 Application Filing Year
- C12Q Class
- 3483 Applications Filed
- 2244 Patents Issued To-Date
- 64.43 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Maeda, Kohshi | Tokyo, JP | 14 | 54 |
# of filed Patents : 14 Total Citations : 54 | |||
Morishima, Daisuke | Tokyo, JP | 7 | 18 |
# of filed Patents : 7 Total Citations : 18 | |||
Tamura, Terumi | Tokyo, JP | 17 | 195 |
# of filed Patents : 17 Total Citations : 195 |
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- 0 Citation Count
- C12Q Class
- 0 % this patent is cited more than
- 5 Age
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