SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS
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United States of America Patent
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Jan 25, 2018
app pub date -
Jul 7, 2017
filing date -
Jul 19, 2016
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Abstract
Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
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