Defect detection device and production system
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United States of America Patent
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Jul 2, 2019
Grant Date -
Jan 25, 2018
app pub date -
Sep 29, 2017
filing date -
Jul 8, 2014
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.
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International Classification(s)
- B24B:MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR PO....
- B23Q:DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TO....
- B05B:SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- G06T:IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
- G06K:RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD ....
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