TEST SUPPORT DEVICE AND TEST SUPPORT METHOD
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United States of America Patent
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Jun 21, 2017
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Jul 21, 2016
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Abstract
A test support device includes a processor configured to acquire event information on events which occur during an execution of a target program. The processor is configured to classify the events into event groups on basis of similarity of timings at which the respective events occur. The processor is configured to calculate, for each of the event groups, a summed value of evaluation values of the respective events classified into the relevant event group. The processor is configured to determine for each of the event groups, on basis of the summed value, whether a breakpoint of a target process executed by the target program is present at a timing corresponding to the relevant event group. The processor is configured to display timing information indicating a timing at which a breakpoint is determined to be present, in association with elapsed time after a start of executing the target program.
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