PROCESSOR TESTING
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United States of America Patent
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app pub date -
Oct 2, 2017
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Oct 20, 2010
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Abstract
A process for processor testing includes generating a set of test instructions having a first portion and a second portion. A first branch instruction is randomly generated for the first portion where the first branch instruction branches to a respective instruction in a second portion by a branching location offset. A second branch instruction is randomly generated for the second portion where the second branch instruction branches to a respective instruction in the first portion by the branching location offset. If additional instructions are to be added to the set of test instructions, a value of the branching location offset is incrementing by a predetermined amount.
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