IMAGE RECONSTRUCTION METHOD FOR X-RAY MEASURING DEVICE, STRUCTURE MANUFACTURING METHOD, IMAGE RECONSTRUCTION PROGRAM FOR X-RAY MEASURING DEVICE, AND X-RAY MEASURING DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America Patent

SERIAL NO

15549010

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

An image reconstruction method, includes: generating differential data indicating a difference between detection data generated by detecting X-ray that passed through a measurement object by irradiating X-rays to the measurement object and estimate data generated by estimating X-rays that are assumed to have been passed through an estimated structure having been generated by estimating a shape of the measurement object; and generating an image using the differential data and the estimated structure.

First Claim

See full text

Other Claims data not available

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
NIKON CORPORATIONA CORP OF JAPAN 2-3 MARUNOUCHI 3-CHOME CHIYODA-KU TOKYO

International Classification(s)

loading....
  • 2015 Application Filing Year
  • G01N Class
  • 11310 Applications Filed
  • 8345 Patents Issued To-Date
  • 73.79 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
YAMADA, Atsushi Yokohama-shi, JP 406 3161

Cited Art Landscape

Load Citation

Patent Citation Ranking

  • 1 Citation Count
  • G01N Class
  • 40.30 % this patent is cited more than
  • 7 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges28583658330822943412011104601 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +01000200030004000250500750125015001750225025002750325035003750

Forward Cite Landscape

Load Citation