Semiconductor device including field effect transistor and a method for fabricating the same
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 4, 2018
Grant Date -
Jan 18, 2018
app pub date -
Jul 14, 2016
filing date -
Jul 14, 2016
priority date (Note) -
In Force
status (Latency Note)
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Abstract
In a method of fabricating a field effect transistor, a fin structure made of a first semiconductor material is formed so that the fin structure protrudes from an isolation insulating layer disposed over a substrate. A gate structure is formed over a part of the fin structure, thereby defining a channel region, a source region and a drain region in the fin structure. After the gate structure is formed, laser annealing is performed on the fin structure.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD | HSINCHU | |
NATIONAL TAIWAN UNIVERSITY | NO 1 SEC 4 ROOSEVELT RD TAIPEI 10617 |
International Classification(s)

- 2016 Application Filing Year
- H01L Class
- 27971 Applications Filed
- 23507 Patents Issued To-Date
- 84.05 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Huang, Shih-Hsien | Yilan County, TW | 60 | 372 |
# of filed Patents : 60 Total Citations : 372 | |||
Liu, CheeWee | Taipei, TW | 16 | 46 |
# of filed Patents : 16 Total Citations : 46 | |||
Liu, Chi-Wen | Hsinchu, TW | 285 | 7442 |
# of filed Patents : 285 Total Citations : 7442 | |||
Lu, Fang-Liang | New Taipei, TW | 20 | 38 |
# of filed Patents : 20 Total Citations : 38 | |||
Wong, I-Hsieh | Kaohsiung, TW | 38 | 101 |
# of filed Patents : 38 Total Citations : 101 |
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- 0 Citation Count
- H01L Class
- 0 % this patent is cited more than
- 7 Age
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