Semiconductor device including field effect transistor and a method for fabricating the same

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United States of America Patent

PATENT NO 10068995
APP PUB NO 20180019326A1
SERIAL NO

15210388

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Abstract

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In a method of fabricating a field effect transistor, a fin structure made of a first semiconductor material is formed so that the fin structure protrudes from an isolation insulating layer disposed over a substrate. A gate structure is formed over a part of the fin structure, thereby defining a channel region, a source region and a drain region in the fin structure. After the gate structure is formed, laser annealing is performed on the fin structure.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTDHSINCHU
NATIONAL TAIWAN UNIVERSITYNO 1 SEC 4 ROOSEVELT RD TAIPEI 10617

International Classification(s)

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  • 2016 Application Filing Year
  • H01L Class
  • 27971 Applications Filed
  • 23507 Patents Issued To-Date
  • 84.05 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Shih-Hsien Yilan County, TW 60 372
Liu, CheeWee Taipei, TW 16 46
Liu, Chi-Wen Hsinchu, TW 285 7442
Lu, Fang-Liang New Taipei, TW 20 38
Wong, I-Hsieh Kaohsiung, TW 38 101

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges3689997611243481558461392216162801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +05001000150020002500300035004000450050005500600065007000750080008500900095001000010500

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