SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR, AND ELECTRONIC DEVICE

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United States of America Patent

SERIAL NO

15548257

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Abstract

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A manufacturing method for a semiconductor device, comprising: providing a semiconductor substrate (100), and forming a shallow trench isolation structure (104) in the semiconductor substrate (100); forming a gate structure comprising a gate oxidation layer (105a) and a gate material layer (105b) that are stacked from the bottom up on the semiconductor substrate (100); executing first ion implantation so as to form first doping ions in the gate material layer (105b), and executing second ion implantation (109) so as to form second doping ions at the part of the gate material layer (105b) that is located over a top corner of the shallow trench isolation structure(104), the second doping ions and the first doping ions being opposite in conduction type.

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Patent Owner(s)

Patent OwnerAddress
CSMC TECHNOLOGIES FAB2 CO LTD214028 NO 8 XINZHOU ROAD NATIONAL HI TECH INDUSTRIAL DEVELOPMENT ZONE WUXI JIANGSU WUXI CITY JIANGSU PROVINCE 214028

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HAO, Long Jiangsu, CN 4 3
JIN, Yan Jiangsu, CN 63 269
LI, Wei Jiangsu, CN 2284 14552

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