Testing non-volatile memories
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United States of America Patent
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Jul 18, 2016
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Jul 18, 2016
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Abstract
A computer-implemented method includes receiving probability distribution function (PDF) data corresponding to bit-error-rate (BER) data for each of a plurality of data blocks within a qualified set of NVRAMS, collecting non-exhaustive bit-error-rate data for each of the data blocks on a tested NVRAM to produce non-exhaustive test data for each of the data blocks, determining a plurality of stable data blocks on the tested NVRAM based on the non-exhaustive test data and the probability distribution function data for each of the data blocks, determining, from the non-exhaustive test data, an inferior data block for the stable data blocks on the tested NVRAM, collecting exhaustive bit-error-rate data on the inferior data block to produce exhaustive test data for the tested NVRAM, and routing the tested NVRAM according to the exhaustive test data. A corresponding computer program product and computer system are also disclosed herein.
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