Persistent command parameter table for pre-silicon device testing
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United States of America Patent
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May 14, 2019
Grant Date -
Jan 18, 2018
app pub date -
Oct 4, 2017
filing date -
Feb 12, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
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