Hierarchical data processor tester
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United States of America Patent
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Nov 5, 2019
Grant Date -
Jan 18, 2018
app pub date -
Jul 14, 2016
filing date -
Jul 14, 2016
priority date (Note) -
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Abstract
A hierarchical data processor test system (and method) is usable to configure a hierarchical plurality of similarity operators and process predetermined input test data through a data processor under test (DPUT) to produce corresponding DPUT output data. The test system is further usable to process the DPUT output data and the predetermined output test data through at least some of the plurality of similarity operators in hierarchical order, determine a highest order similarity operator that indicates a match between the DPUT output data and the predetermined output test data, and compute a confidence score based on the highest order similarity operator that indicated the match. Based on the confidence score exceeding a threshold, the test system also may include activating the DPUT for use by non-test data.
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