Measuring a slew rate on-chip
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United States of America Patent
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Jan 8, 2019
Grant Date -
Jan 18, 2018
app pub date -
Jul 13, 2016
filing date -
Jul 13, 2016
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Abstract
A method, apparatus, and computer program product for measuring a slew rate of a digital high speed repeating signal on-chip including, transforming the rising and the falling edges of the signal into a digital pulse signal each; and selecting the digital pulse signals corresponding either to the rising edge or to the falling edge of the signal. Further the method including converting the selected digital pulse signals into an average DC voltage equivalent to the pulse width of the respective digital pulse signal; as well as converting each DC voltage into a binary value.
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