Low force wafer test probe

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10444260
APP PUB NO 20180017592A1
SERIAL NO

15208185

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Abstract

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A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Audette, David M Colchester, US 78 1074
Conti, Dennis R Essex Junction, US 15 194
Knox, Marc D Hinesburg, US 20 116
Wagner, Grant W Burlington, US 11 38

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