IGBT GATE CURRENT SLOPE MEASURE TO ESTIMATE MILLER PLATEAU

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United States of America Patent

APP PUB NO 20180013416A1
SERIAL NO

15633953

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and apparatus are provided for controlling a drive terminal of a power transistor by applying a turn-off voltage to the drive terminal at a turn-off time, measuring a gate current at the drive terminal to detect a predetermined gate current slope, determining a first time increment after the turn-off time when the predetermined gate current slope is detected, determining a second time increment which is proportional to the first time increment and which expires within a Miller plateau for the power transistor, and lowering the gate current at the drive terminal to a predetermined current level upon expiration of the second time increment in order to reduce overvoltages at the power transistor.

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Patent Owner(s)

Patent OwnerAddress
NXP USA INC6501 WILLIAM CANNON DRIVE WEST AUSTIN TX 78735

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sicard, Thierry Auzeville tolosane, FR 48 323

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges306935117261382111201 - 1011 - 2021 - 3031 - 4041 - 5051 - 6071 - 8081 - 9091 - 100100 +0501001502002503003504004505005506006507007508008509009501000

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