Epitaxial wafer manufacturing method, epitaxial wafer, semiconductor device manufacturing method, and semiconductor device

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United States of America Patent

PATENT NO 10354867
APP PUB NO 20180012758A1
SERIAL NO

15712644

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Abstract

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A method for manufacturing an epitaxial wafer comprising a silicon carbide substrate and a silicon carbide voltage-blocking-layer, the method includes: epitaxially growing a buffer layer on the substrate, doping a main dopant for determining a conductivity type of the buffer layer and doping an auxiliary dopant for capturing minority carriers in the buffer layer at a doping concentration less than the doping concentration of the main dopant, so that the buffer layer enhances capturing and extinction of the minority carriers, the minority carriers flowing in a direction from the voltage-blocking-layer to the substrate, so that the buffer layer has a lower resistivity than the voltage-blocking-layer, and so that the buffer layer includes silicon carbide as a main component; and epitaxially growing the voltage-blocking-layer on the buffer layer.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC CO LTD1-1 TANABESHIDEN KAWASAKI-KU KAWASAKI-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kato, Tomohisa Tsukuba, JP 46 190
Kojima, Kazutoshi Tsukuba, JP 11 150
Miyazawa, Tetsuya Yokosuka, JP 6 41
Otsuki, Akihiro Mitaka, JP 6 42
Tawara, Takeshi Tsukuba, JP 33 146
Tsuchida, Hidekazu Yokosuka, JP 56 391
Yonezawa, Yoshiyuki Tsukuba, JP 23 250

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