ERROR DIAGNOSIS METHOD AND ERROR DIAGNOSIS SYSTEM

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United States of America Patent

SERIAL NO

15545423

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Abstract

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An error diagnosis method includes: the parameter value obtaining step of obtaining multiple parameter values; the error detection step of calculating a Mahalanobis distance from a unit space based on the obtained parameter values and diagnosing whether or not error is caused at the real machine based on the calculated Mahalanobis distance; the error portion estimation step of estimating a error portion of the real machine based on the Mahalanobis distance calculated at the error detection step; and the matching determination step of structuring an error analyzing model for analyzing the real machine based on the error portion of the real machine estimated at the error portion estimation step and determining whether or not an output analytical signal of the real machine obtained by analysis of the error analyzing model and the output signal output from the real machine match with each other.

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Patent OwnerAddress
MITSUBISHI HEAVY INDUSTRIES LTD2-3 MARUNOUCHI 3-CHOME CHIYODA-KU TOKYO 100-8332

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Inventor Name Address # of filed Patents Total Citations
NAGASE, Tetsuya Tokyo, JP 25 337

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