Characterization of phase shifter circuitry in integrated circuits (ICs) using standard automated test equipment (ATE)
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United States of America Patent
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Aug 6, 2019
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Jan 11, 2018
app pub date -
Jul 11, 2016
filing date -
Jul 11, 2016
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Abstract
A method for characterizing a phase shifter in a device under test (DUT) using automated test equipment (ATE) is disclosed. The method comprises down converting an input signal received from the transmitter DUT to an intermediate frequency and routing the down converted input signal to a signal processor, wherein the signal processor generates I and Q signals using the input signal. The method further comprises setting an initial phase state on the phase shifter in the transmitter DUT and toggling at least one phase state bit to control the phase shifter to cycle through a plurality of phase states, wherein the changing phase states appear on the I and Q signals. Finally, the method comprises processing the I and Q signals to extract individual phase states programmed by the at least one phase state bit.
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