Circuit arrangement for high-voltage tests and high-voltage testing system
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United States of America Patent
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Jul 9, 2019
Grant Date -
Jan 11, 2018
app pub date -
Jan 7, 2016
filing date -
Jan 21, 2015
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Abstract
A circuit configuration for high-voltage tests includes an AC voltage source and at least two circuit branches, each of which can be electrically connected to the AC voltage source. An electrical AC voltage can be applied to a test object by a first circuit branch, and an electrical DC voltage can be applied to the test object by a second circuit branch which rectifies an AC voltage.
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