Sequential Diffractive Pattern Projection

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United States of America Patent

SERIAL NO

15546487

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Abstract

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The present disclosure relates to structured illumination. The teachings thereof may be embodied in devices for reconstruction of a three-dimensional surface of an object by means of a structured illumination for projection of measurement patterns onto the object. For example, a device may include: a projector unit for diffractive projection of a measurement pattern comprising a plurality of measurement points onto the surface; an acquisition unit for acquiring the measurement pattern from the surface; and a computer unit for reconstruction of the surface from a respective distortion of the measurement pattern. All possible positions of measurement elements are contained in the measurement pattern in repeating groups, in which a respective combination of measurement points represents a respective location in the measurement pattern.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS AKTIENGESELLSCHAFTWERNER-VON-SIEMENS-STRASSE 1 MUENCHEN 80333

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Forster, Frank Muenchen, DE 36 519
Schick, Anton Velden, DE 39 429
Wissmann, Patrick Muenchen, DE 18 91

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