COMPACT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST (DUT) HAVING INTEGRATED ANTENNA ARRAY
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
May 1, 2017
filing date -
Jun 30, 2016
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A system is provided for characterizing a device under test (DUT) including an integrated antenna array. The system includes an optical subsystem having first and second focal planes, where the integrated antenna array is positioned substantially on the first focal plane of the optical subsystem. The system further includes a measurement array having one or more array elements positioned substantially on the second focal plane of the optical subsystem, the measurement array being configured to receive signals transmitted from the integrated antenna array via the optical subsystem. A far-field radiation pattern of the integrated antenna array is created at the measurement array, enabling measurements of DUT parameters at each array element of the one or more array elements in the measurement array.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully