Problem detection apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10622685
APP PUB NO 20180006340A1
SERIAL NO

15492231

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A problem detection apparatus includes a relay, a measurement circuit and a controller. The relay is provided between a power supply and an external circuit, both of which are in a high voltage system. The relay is configured to switch an electrical connection state of the power supply to the external circuit between a closed state and an open state. The measurement circuit measures a voltage of a circuit in the high voltage system. The measurement circuit is in the high voltage system and connected between the relay and the external circuit. In a case where a command to switch the relay to the open state has been output, the controller detects, based on the voltage measured by the measurement circuit, whether or not the relay has a short circuit. The controller is in a low voltage system having a lower voltage than a voltage of the high voltage system.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU TEN LIMITED2-28 GOSHO-DORI 1-CHOME HYOGO-KU KOBE-SHI HYOGO 652-8510

International Classification(s)

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  • 2017 Application Filing Year
  • H01M Class
  • 6607 Applications Filed
  • 4942 Patents Issued To-Date
  • 74.80 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Terada, Yohei Kobe, JP 4 14
Yamamoto, Haruhiro Kobe, JP 1 6

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Patent Citation Ranking

  • 2 Citation Count
  • H01M Class
  • 57.30 % this patent is cited more than
  • 5 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges19981435458101 - 1011 - 2021 - 3031 - 400100200300400500600700800900100011001200130014001500160017001800190020002100

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