Circuit design instrumentation for state visualization
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United States of America Patent
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Aug 28, 2018
Grant Date -
Jan 4, 2018
app pub date -
Sep 18, 2017
filing date -
Jan 30, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
An integrated circuit includes user storage circuits, a local control circuit, and scan storage circuits arranged in a scan chain. At least a portion of a design-under-test is implemented in a subset of the integrated circuit that comprises the user storage circuits. The local control circuit retrieves data stored in the user storage circuits through the scan storage circuits without erasing the data stored in the user storage circuits after halting oscillations in a user clock signal that clocks the user storage circuits. The local control circuit restarts oscillations in the user clock signal after the data is provided from the user storage circuits to the scan storage circuits.
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