Transformer testing device, and method for testing a transformer

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United States of America Patent

PATENT NO 10914778
APP PUB NO 20180003760A1
SERIAL NO

15543063

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Abstract

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A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).

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Patent Owner(s)

Patent OwnerAddress
OMICRON ELECTRONICS GMBHAUSTRIA CRATON KLAUS STEIERMARK

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Flax, Dirk Dornbirn, AT 5 4
Pütter, Markus Sulz, AT 3 9

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