SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICATION INFORMATION
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United States of America Patent
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Issued Date -
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app pub date -
Sep 13, 2017
filing date -
Mar 18, 2015
priority date (Note) -
Published
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Abstract
A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that collects the rack transported from the measurement unit by the transport unit and sets the rack in the tray; a storage that stores sample identification information, rack identification information, and tray identification information in association with each other; an input part; a display part; and a controller that, in a condition in which the input part receives input of the sample identification information or the rack identification information, causes the display part to display the tray identification information stored in association with the inputted sample identification information or the inputted rack identification information.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SYSMEX CORPORATION | 5-1 WAKINOHAMA-KAIGANDORI 1-CHOME CHUO-KU KOBE-SHI HYOGO 651-0073 |
International Classification(s)

- 2017 Application Filing Year
- G01N Class
- 13595 Applications Filed
- 8906 Patents Issued To-Date
- 65.51 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
OHMAE, Yuichiro | Kobe-shi, JP | 29 | 116 |
# of filed Patents : 29 Total Citations : 116 | |||
TATSUTANI, Hiroo | Kobe-shi, JP | 36 | 153 |
# of filed Patents : 36 Total Citations : 153 |
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Patent Citation Ranking
- 1 Citation Count
- G01N Class
- 40.30 % this patent is cited more than
- 7 Age
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