Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
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United States of America Patent
Stats
-
Dec 29, 2020
Grant Date -
Dec 28, 2017
app pub date -
Jun 9, 2017
filing date -
Jun 24, 2016
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle a in a pole figure with the small number of times of ϕ scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of. receiving input of a diffraction angle 2θ; and determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each ϕ scan for a rotation angle ϕ within a sample plane so as to make a range of an angle a continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2θ, in which determining the angle ω and the tilt angle χ is repeated.
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International Classification(s)
- 2017 Application Filing Year
- G01N Class
- 13595 Applications Filed
- 8906 Patents Issued To-Date
- 65.51 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01N Class
- 57.64 % this patent is cited more than
- 5 Age
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