Localized Environment Characterization Device

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United States of America Patent

SERIAL NO

15538045

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Abstract

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Various apparatuses and methods are provided for measuring the likely environmental impact of a particular geographic location on power generation properties of potential solar installations at the particular location. In an example embodiment of one such apparatus, a measurement device is provided. The measurement device includes a base portion comprising a base frame element disposed on a plurality of supporting legs, and a top panel comprising a series of connected members and one or more measurement modules whose planar dimensions are defined by the series of connected members. The top panel is connected to the base portion by a joint such that the top panel can rotate about the joint, and a panel support element is configured to fasten the top panel immovably at a desired degree of rotation in relation to the base portion.

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Patent Owner(s)

Patent OwnerAddress
KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY4700 KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY THUWAL 23955-6900

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aljohani, Ahmed Thuwal, SA 1 2
Alzain, Hashim Thuwal, SA 1 2
Shahin, Tamer Thuwal, SA 1 2
Wafai, Husam Thuwal, SA 1 2

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