Systems and methods for rapidly fabricating nanopatterns in a parallel fashion over large areas

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United States of America Patent

PATENT NO 10207469
APP PUB NO 20170361551A1
SERIAL NO

15534312

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Abstract

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Nanopantography is a method for patterning nanofeatures over large areas. Transfer of patterns defined by nanopantography using highly selective plasma etching, with an oxide layer of silicon serving as a hard mask, can improve patterning speed and etch profile. With this method, high aspect ratio features can be fabricated in a substrate with no mask undercut. The ability to fabricate complex patterns using nanopantography, followed by highly selective plasma etching, provides improved patterning speed, feature aspect ratio, and etching profile.

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Patent Owner(s)

Patent OwnerAddress
UNIVERSITY OF HOUSTON SYSTEM4800 CALHOUN ROAD HOUSTON TX 77004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Donnelly, Vincent M Houston, US 14 997
Economou, Demetre J Houston, US 10 760
Tian, Siyuan Houston, US 22 49

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