TARGET ANALYSIS TOOL AND TARGET ANALYSIS METHOD

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United States of America Patent

SERIAL NO

15545534

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Abstract

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A target analysis tool and a target analysis method that allow easily analysis of a target. The first target analysis tool includes: a first chamber; a second chamber; and a third chamber. The first chamber, the second chamber, and the third chamber are disposed continuously in this order. The first chamber contains, as a first reagent, an immobilized first binding substance obtained by immobilizing, on a carrier, a first binding substance that binds to a target. The second chamber contains, as a second reagent, a labeled second binding substance obtained by binding a labeling substance to a second binding substance that binds to the first binding substance. The third chamber is a detection section in which the labeled second binding substance is detected.

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Patent Owner(s)

Patent OwnerAddress
LABLABOTECHNOSITE ALTÉA 269 RUE GEORGES CHARPAK JUVIGNY 74100

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AKITOMI, Jou Tokyo, JP 44 51
HORII, Katsunori Tokyo, JP 43 92
KANEKO, Naoto Tokyo, JP 35 132
WAGA, Iwao Tokyo, JP 45 52
YOSHIDA, Yoshihito Tokyo, JP 14 7

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