SURVEY SYSTEM
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United States of America Patent
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app pub date -
Jun 9, 2017
filing date -
Jun 14, 2016
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Abstract
Provided is a survey system capable of acquiring point group data of a three-dimensional object desired to be measured without complicated setting. A survey system includes a surveying instrument including a tracking section that tracks a target by emitting tracking light and receiving the tracking light reflected on the target, and a scanner that rotates horizontally and integrally with the surveying instrument and performs scanning around a single axis in a vertical direction, and the scanner and the tracking section are offset in the horizontal direction. Therefore, a scanning line (SL) does not match the target, and is always controlled around the target.
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