HIGH-PRESSURE-RESISTANCE SPECIMEN CHAMBER FOR TRANSMITTED LIGHT MICROSCOPY AND METHOD FOR PRODUCING SAME
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United States of America Patent
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N/A
Issued Date -
Nov 30, 2017
app pub date -
Dec 4, 2015
filing date -
Dec 15, 2014
priority date (Note) -
Published
status (Latency Note)
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Abstract
A specimen chamber for transmitted light microscopy includes a chamber body having a specimen space that is sealed off in a transmitted light direction on opposite sides by transparent first and second observation windows, respectively, a seal being interposed in each case. First and second clamping elements are configured to fix the two observation windows to the specimen space. The clamping elements comprise observation openings into the specimen chamber. The first observation window comprises a first plane-parallel shoulder that protrudes into the first observation opening of the first clamping-element so as to fit exactly. The second observation window comprises a second plane-parallel shoulder that protrudes into the second observation opening of the second clamping element so as to fit exactly. The two seals are resistant to high pressure. The observation windows and the seals each consist of a plastomer.
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- 15 United States
- 10 France
- 8 Japan
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- 5 Korea
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
ALFRED-WEGENER-INSTITUT HELMHOLTZ-ZENTRUM FUER POLAR- UND MEERESFORSCHUNG | AM HANDELSHAFEN 12 BREMERHAVEN 27570 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Dunker, Erich | Schiffdorf, DE | 6 | 28 |
# of filed Patents : 6 Total Citations : 28 | |||
Wollenburg, Jutta | Hechthausen-Bornberg, DE | 1 | 0 |
# of filed Patents : 1 Total Citations : 0 |
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