TEST DEVICE

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United States of America Patent

SERIAL NO

15477081

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Abstract

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A test device for testing an electronic device has a base, a first mounting plane, a first support element, a plurality of second support elements, a plurality of test elements, and a control unit. The first mounting plane is mounted on the base. The first support element is slidable on the first mounting plane, the second support elements are slidable on the first support element, and the test elements are slidable on the second support elements. The control unit electrically coupled to the test elements controls the test elements to provide impact force on the electronic device.

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Patent Owner(s)

Patent OwnerAddress
HON HAI PRECISION INDUSTRY CO LTDNO 66 JHONGSHAN RD TUCHENG DIST NEW TAIPEI CITY 236038
FU TAI HUA INDUSTRY (SHENZHEN) CO LTDAREA B FOXCONN GUANLAN TECHNOLOGY PARK DASAN COMMUNITY GUANLAN SUB-DISTRICT SHENZHEN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HSIEH, KUN-JIA New Taipei, TW 2 1
HUANG, I-CHENG New Taipei, TW 3 1
HUANG, WEN-HSIEN New Taipei, TW 17 58
YANG, KANG-XIAN Shenzhen, CN 2 1

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