Transformer test device and method for testing a transformer

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United States of America Patent

PATENT NO 10955490
APP PUB NO 20170336462A1
SERIAL NO

15522323

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Abstract

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A transformer test device (10) for testing a transformer (40) has connections (12) for releasably connecting the transformer test device (10) to the transformer (40). The transformer test device (10) has a source (13) for generating a test signal for testing the transformer (40). The transformer test device (10) has a controllable switching means (15) which is connected to the connections (12) during a transformer test for the purpose of short-circuiting at least one winding (42) of the transformer (40).

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Patent Owner(s)

Patent OwnerAddress
OMICRON ELECTRONICS GMBH6833 KLAUS

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaufmann, Reinhard Thüringerberg, AT 11 115
Pütter, Markus Sulz, AT 3 9
Unterer, Boris Feldkirch, AT 4 8

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