SURFACE MEASUREMENT PROBE

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United States of America Patent

SERIAL NO

15522127

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Surface measurement probe comprising:

    a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end;a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state;a probe tip supported at the distal end of the probe body and arranged to contact a sample;a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

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Patent Owner(s)

Patent OwnerAddress
ANTON PAAR TRITEC SA2034 PESEUX

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BELLATON, Bertrand Neuchâtel, CH 8 31
CONTE, Marcello Neuchâtel, CH 5 9

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges216962105211977532301 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8091 - 100100 +05010015020025030035040045050055060065070075080085090095010001050

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