SURFACE MEASUREMENT PROBE
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Nov 2, 2015
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Abstract
Surface measurement probe comprising:
- a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end;a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state;a probe tip supported at the distal end of the probe body and arranged to contact a sample;a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
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ANTON PAAR TRITEC SA | 2034 PESEUX |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
BELLATON, Bertrand | Neuchâtel, CH | 8 | 31 |
# of filed Patents : 8 Total Citations : 31 | |||
CONTE, Marcello | Neuchâtel, CH | 5 | 9 |
# of filed Patents : 5 Total Citations : 9 |
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7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | May 23, 2025 |
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Full Text
US Patent Application No: 2017/0336,188
SURFACE MEASUREMENT PROBE
Abstract
Surface measurement probe comprising:
- a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end;a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state;a probe tip supported at the distal end of the probe body and arranged to contact a sample;a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.
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