ALUMINUM PRECURSORS FOR THIN-FILM DEPOSITION, PREPARATION METHOD AND USE THEREOF

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United States of America Patent

SERIAL NO

15517651

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Abstract

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Provided is an aluminum precursor for thin-film deposition having a structure of formula (I) or (II), wherein R1, R2, R3, R4, R5, R6, and R7 each independently represent a hydrogen atom, C1˜C6 alkyl, halo-C1˜C6 alkyl, C2˜C5 alkenyl, halo-C2˜C5 alkenyl, C3˜C10 cycloalkyl, halo-C3˜C10 cycloalkyl, C6˜C10 aryl, halo-C6˜C10 aryl or —Si(R0)3, and wherein R0 is C1˜C6 alkyl or halo-C1˜C6 alkyl. According to the present invention, based on the interaction principle between molecules, aluminum precursors for thin-film deposition are provided, which have a good thermal stability, are not susceptible to decomposition and convenient for storage and transportation, have good volatility at a high temperature, and are excellent in film formation.

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Patent Owner(s)

Patent OwnerAddress
INSTITUTE OF MICROELECTRONICS CHINESE ACADEMY OF SCIENCESNO 3 BEITUCHENG WEST ROAD CHAOYANG DISTRICT BEIJING 100029
JIANGNAN UNIVERSITYWUXI JIANGSU 214122

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
DING, Yuqiang Wuxi, CN 4 5
MIAO, Hongyan Wuxi, CN 2 3
WANG, Dawei Wuxi, CN 174 616
XIANG, Jinjuan Beijing, CN 6 9
XU, Chongying Bear, DE 153 7154
YANG, Shuyan Wuxi, CN 5 1
ZHAO, Chao Kessel-lo, BE 139 838

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