EPITAXIAL WAFER, SEMICONDUCTOR DEVICE, METHOD FOR PRODUCING EPITAXIAL WAFER, AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

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United States of America Patent

SERIAL NO

15525153

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Abstract

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An epitaxial wafer including: a silicon-based substrate; a first buffer layer on the substrate and including a first multilayer structure buffer region composed of AlxGa1-xN layers and AlyGa1-yN layers (x>y) alternately disposed and a first insertion layer composed of an AlzGa1-zN layer (x>z) and is thicker than the AlyGa1-yN layer, the first regions and insertion layers alternately disposed; a second buffer layer on the first and including a second multilayer structure buffer region composed of AlαGa1-αN layers and AlβGa1-βN layers (α>β) alternately disposed and a second insertion layer composed of an AlγGa1-γN layer (α>γ) and is thicker than the AlβGa1-βN layer, the second regions and insertion layers alternately disposed; and a channel layer on the second buffer layer and thicker than the second insertion layer. The average Al composition in the second buffer layer is higher than that in the first.

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Patent Owner(s)

Patent OwnerAddress
SANKEN ELECTRIC CO LTD3-6-3 KITANO NIIZA-SHI SAITAMA-KEN 352-8666
SHIN-ETSU HANDOTAI CO LTD2-1 OHTEMACHI 2-CHOME CHIYODA-KU TOKYO 1000004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GOTO, Hirokazu Minato-ku, JP 49 988
HAGIMOTO, Kazunori Takasaki-shi, JP 41 187
SATO, Ken Miyoshi-machi, JP 116 1112
SHIKAUCHI, Hiroshi Niiza-shi, JP 31 69
SHINOMIYA, Masaru Annaka-shi, JP 29 87
TSUCHIYA, Keitaro Takasaki-shi, JP 30 59

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