CHEMICAL MECHANICAL POLISHING APPARATUS FOR POLISHING WORKPIECE

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United States of America Patent

SERIAL NO

15520515

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Abstract

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The present invention relates to a chemical mechanical polishing (CMP) apparatus for polishing a workpiece, such as a metal body, to a mirror finish. The chemical mechanical polishing apparatus includes: a polishing pad (2) having an annular polishing surface (2a) which has a curved vertical cross-section; a workpiece holder (11) for holding a workpiece (W) having a polygonal shape; a rotating device (15) configured to rotate the workpiece holder (11) about an axis of the workpiece (W); a pressing device (14) configured to press a periphery of the workpiece (W) against the annular polishing surface (2a); and an operation controller (25) configured to change a speed at which the rotating device (15) rotates the workpiece (W) according to a rotation angle of the workpiece (W). The pressing device (14) is disposed more inwardly than the workpiece holder (11) in a radial direction of the polishing table (3).

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Patent Owner(s)

Patent OwnerAddress
EBARA CORPORATION11-1 HANEDA ASAHI-CHO OTA-KU TOKYO 144-8510
FUJIMI INCORPORATED1-1 CHIRYO 2-CHOME NISHIBIWAJIMA-CHO KIYOSU-SHI AICHI 452-5802

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ASANO, Hiroshi Kiyosu-shi, Aichi, JP 131 976
ISHII, Yu Tokyo, JP 38 531
ITO, Kenya Tokyo, JP 114 1765
MORINAGA, Hitoshi Kiyosu-shi, Aichi, JP 68 521
OHTSUKI, Shingo Kiyosu-shi, Aichi, JP 2 3
TAMAI, Kazusei Kiyosu-shi, Aichi, JP 43 339

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