METHODS, SYSTEMS, AND DEVICES FOR ELECTRODE CAPACITANCE CALCULATION AND APPLICATION
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United States of America Patent
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Apr 28, 2016
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Apr 28, 2016
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The double layer capacitance of a working electrode of a sensor may be measured with minimal disruption to the sensor equilibrium by open circuiting the working electrode and measuring the voltage drift on a periodic, or as-needed, basis. The values of the double layer capacitance may be monitored over time to determine, e.g., sensor age and condition.
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