DNA METHYLATION MARKERS FOR NEURODEVELOPMENTAL SYNDROMES

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United States of America Patent

SERIAL NO

15520570

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Abstract

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The present disclosure provides epigenetic signatures, comprising genomic CpG dinucleotide sequences, genes, and/or genomic regions, which are differentially methylated in individuals with CHARGE syndrome relative to non-CHARGE syndrome controls, and their use in methods and kits for detecting and/or screening for CHARGE syndrome, or the likelihood of CHARGE syndrome. The present disclosure also provides epigenetic signatures, comprising genomic CpG dinucleotide sequences, genes, and/or genomic regions, which are differentially methylated in individuals with Kabuki syndrome relative to non-Kabuki syndrome controls, and their use in methods and kits for detecting and/or screening for Kabuki syndrome, or the likelihood of Kabuki syndrome.

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Patent Owner(s)

Patent OwnerAddress
THE HOSPITAL FOR SICK CHILDRENTORONTO ON M5G 1X8

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BUTCHER, Darci Toronto, CA 1 2
CHOUFANI, Sanaa Maple, CA 2 4
GRAFODATSKAYA, Daria Mississauga, CA 2 4
WEKSBERG, Rosanna Toronto, CA 2 4

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