Measuring wall thickness loss for a structure
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United States of America Patent
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Jul 7, 2020
Grant Date -
Oct 12, 2017
app pub date -
Jun 26, 2017
filing date -
Jan 30, 2013
priority date (Note) -
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Abstract
Systems, methods and computer storage mediums accurately measure wall thickness in a region of interest included in complex curved structures. Embodiments of the present disclosure relate to generating a wall thickness loss distribution map of a region of interest that provides an accurate representation of wall thickness for the region of interest included in a complex curved structure. The wall thickness loss distribution map is generated from a two-dimensional model of the wall thickness loss distribution of the region of interest. The two-dimensional model is converted from a three-dimensional representation of the wall thickness loss distribution of the region of interest. The three-dimensional representation of the wall thickness is generated by ultrasonic waves generated by a transducer system that propagated through the region of interest.
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