Measuring wall thickness loss for a structure
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United States of America Patent
Stats
-
Jul 7, 2020
Grant Date -
Oct 12, 2017
app pub date -
Jun 26, 2017
filing date -
Jan 30, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Systems, methods and computer storage mediums accurately measure wall thickness in a region of interest included in complex curved structures. Embodiments of the present disclosure relate to generating a wall thickness loss distribution map of a region of interest that provides an accurate representation of wall thickness for the region of interest included in a complex curved structure. The wall thickness loss distribution map is generated from a two-dimensional model of the wall thickness loss distribution of the region of interest. The two-dimensional model is converted from a three-dimensional representation of the wall thickness loss distribution of the region of interest. The three-dimensional representation of the wall thickness is generated by ultrasonic waves generated by a transducer system that propagated through the region of interest.
First Claim
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International Classification(s)
- 2017 Application Filing Year
- G01B Class
- 2475 Applications Filed
- 1896 Patents Issued To-Date
- 76.61 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01B Class
- 40.35 % this patent is cited more than
- 5 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Jan 7, 2028 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jan 7, 2032 |
