Techniques for determining emitted radiation intensity
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United States of America Patent
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Jul 12, 2022
Grant Date -
Oct 5, 2017
app pub date -
Apr 3, 2017
filing date -
Apr 4, 2016
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Abstract
Systems and methods according to one or more embodiments are provided for determining an emitted radiation intensity of an object in a thermal image. In one example, a system includes a memory component configured to store a plurality of captured thermal images of a scene and a processor. The processor is configured to select a pixel on a thermal image corresponding to a measured radiation intensity associated with an object in the scene. Real world coordinates of the object are determined. An emitted radiation intensity of the object is calculated using the determined real world coordinates and the measured radiation intensity. Additional systems and methods are also provided.
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