Rejection of mechanical vibration induced noise in electrical measurements
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United States of America Patent
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May 19, 2020
Grant Date -
Oct 5, 2017
app pub date -
Mar 31, 2017
filing date -
Apr 5, 2016
priority date (Note) -
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Abstract
An electronic test measurement system can include a device under test (DUT) and an electronic test instrument that includes a signal input configured to receive an electrical signal from the DUT, a cooling mechanism, and a processor. The processor can be configured to determine a frequency at which the cooling mechanism should operate, cause the cooling mechanism to operate at the determined frequency, select a filter based on the determined frequency, and apply the filter to the electrical signal to reduce interference with the electrical signal resulting from mechanical vibrations of the cooling mechanism.
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