METHOD OF MEASURING AND ASSESSING A PROBE CARD WITH AN INSPECTION DEVICE
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United States of America Patent
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app pub date -
Jun 14, 2017
filing date -
Apr 23, 2010
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Abandoned
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Abstract
A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor head of the probe card analyzer with the probe card, and measuring a component of the probes with the sensor head.
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