Method and system for spectral characterization in computed tomography x-ray microscopy system

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United States of America Patent

PATENT NO 10859515
APP PUB NO 20170276620A1
SERIAL NO

15465937

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Abstract

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A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS X-RAY MICROSCOPY INC5300 CENTRAL PARKWAY DUBLIN CA 94568

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Case, Thomas A Walnut Creek, US 13 160
Huang, Zhifeng Pleasanton, US 19 65
Steger, Lourens B Pleasanton, US 1 5

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