Multi-Dimensional Survey Scans for Improved Data Dependent Acquisitions

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United States of America Patent

SERIAL NO

15417672

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Abstract

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A method of analysing ions is disclosed comprising performing an initial multi-dimensional survey scan comprising separating parent ions according to a first physico-chemical property (e.g. ion mobility) and then separating the parent ions according to a second physico-chemical property (e.g. mass to charge ratio). A plurality of parent ions of interest are then determined from the initial multi-dimensional survey scan. Once parent ions of interest have been determined, the plurality of parent ions of interest are sequentially selected based upon the first and second physico-chemical properties during a single cycle of separation. The parent ions of interest may then be fragmented and corresponding fragment ions may then be mass analysed.

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Patent Owner(s)

Patent OwnerAddress
MICROMASS UK LIMITEDSTAMFORD AVENUE ALTRINCHAM ROAD WILMSLOW SK9 4AX

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GILES, Kevin Stockport, GB 138 1981
WILDGOOSE, Jason Lee Stockport, GB 226 2259

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