ELECTRICAL PARAMETRIC TESTING FOR BACK CONTACT SEMICONDUCTOR SOLAR CELLS

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United States of America Patent

SERIAL NO

15284475

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Abstract

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Methods and structures for extracting at least one electric parametric testing from a back contact solar cell are provided.

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Patent Owner(s)

Patent OwnerAddress
OB REALTY LLC19900 MACARTHUR BLVD 12TH FLOOR IRVINE CA 92647

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kapur, Pawan Burlingame, US 72 1111
Kommera, Swaroop San Jose, US 7 54
Moslehi, Mehrdad M Los Altos, US 307 13906

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