METHODS AND SYSTEMS FOR FUNCTIONAL ANALYSIS OF AN INTEGRATED CIRCUIT

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United States of America Patent

SERIAL NO

15583316

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Abstract

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An apparatus for monitoring operation of a design under test (DUT) comprises a plurality of inputs comprising: an incoming clock edge input connected to detect active clock edges provided to a monitored clock gate; an outgoing clock edge input connected to detect active clock edges sent from the monitored clock gate; an enable input connected to detect enable signals provided to the monitored clock gate and any leaf clock gates connected to receive clock edges through the monitored clock gate; and a protocol input connected to receive protocol signals specifying when the monitored clock gate is required to output active clock edges. The apparatus also comprises a memory in communication with the inputs for storing values from the inputs, and a processor in communication with the memory and the inputs, the processor programmed to determine protocol compliance and to calculate energy consequences of dropping of active clock edges.

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Patent Owner(s)

Patent OwnerAddress
MICROSEMI SOLUTIONS (U S ) INCONE ENTERPRISE ALISO VIEJO CA 92656

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
WILSON, Theodore Vancouver, CA 9 1261

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