Illumination filter system and observation system for a multispectral fluorescence microscope, multispectral fluorescence microscope, and microscopying method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10823947
APP PUB NO 20170235118A1
SERIAL NO

15424815

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The present invention relates to an illumination filter system (2) for medical imaging, in particular multispectral fluorescence imaging, as performed e.g. in a microscope (1) or endoscope, such as a surgical microscope, in particular a surgical multispectral fluorescence microscope, comprising a first optical filter (35). The present invention also relates to an observation system (3) for medical imaging, in particular multispectral fluorescence imaging, as performed e.g. in a microscope (1) or endoscope, in particular a multispectral fluorescence microscope, comprising a beam splitter (21) adapted to split a light image (13) into a first light portion (16, 17) along a first light path (18) and a second light portion (20) along a second light path (19). To improve known illumination filter systems and observation systems, so these systems work with one light source only, are capable of capturing simultaneously at least one fluorescence signal and a signal of visible reflected light and allow a homogeneous illumination for obtaining different images from the object illuminated, the first optical filter (36) is adapted to quench light of at least one fluorescence excitation band within the visible spectrum in the illumination filter system (2) of the present invention, and the first light portion (16, 17) comprises at least one fluorescence emission band (Em.1, Em.2) in the visible spectrum and the second light portion (20) portion comprises a visible reflected light (VISR) in the observation system (3) of the present invention.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
LEICA INSTRUMENTS (SINGAPORE) PTE LTDSINGAPORE

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kuster, Manfred Widnau, CH 26 839
Themelis, George Lindau, DE 58 262

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
7.5 Year Payment $3600.00 $1800.00 $900.00 May 3, 2028
11.5 Year Payment $7400.00 $3700.00 $1850.00 May 3, 2032
Fee Large entity fee small entity fee micro entity fee
Surcharge - 7.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00