Force measurement with real-time baseline determination

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United States of America Patent

PATENT NO 9910064
SERIAL NO

15438429

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Abstract

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An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD SANTA BARBARA CA 93117

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hu, Shuiqing Santa Barbara, US 28 165
Liu, Changchun Goleta, US 29 153
Pittenger, Bede Santa Barbara, US 12 33
Su, Chanmin Ventura, US 62 764

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