APPARATUS AND METHOD FOR TREATING SUBSTRATES

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United States of America Patent

SERIAL NO

15490033

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Abstract

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Provided are an apparatus and a method for treating substrates. The apparatus includes a process chamber, a support plate to support a substrate inside the process chamber, a gas supply unit to supply a gas into the process chamber, a first plasma generation unit provided to generate plasma inside the process chamber, and a second plasma generation unit provided to generate plasma outside the process chamber. An etching process, an ashing process, an edge cleaning process, and a back-surface cleaning process are sequentially performed on the substrate inside the process chamber.

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Patent Owner(s)

Patent OwnerAddress
PSK INCGYEONGGI DO SOUTH KOREA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHAE, Hee Sun Hwaseong-si, KR 14 69
CHO, Jeonghee Hwaseong-si, KR 16 49

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