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United States of America Patent
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Feb 2, 2016
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Feb 2, 2016
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Abstract
In some examples, a method is described. The method may include obtaining an electrical signal as an input signal. The method may also include generating a reference signal based on the input signal. Moreover, the method may include generating a device-under-test signal based on the input signal and based on a device-under-test capacitance between a first contact point and a second contact point. The first contact point may be electrically coupled to a first contact mechanism configured to contact a first contact area of the device-under-test. The second contact point may be configured to be electrically coupled to a second contact mechanism configured to contact a second contact area of the device-under-test. The method may also include generating a comparison signal based on a comparison between the reference signal and the device-under-test signal. Additionally, the method may include emitting an output signal that is based on the comparison signal.
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